【HIOKI】FLYING PROBE TESTER FA1240-6x

FLYING PROBE TESTER FA1240-6x

• Quickly complete programs that take into account component height

• Automatic calculation of arm interference (when used with the UA1780)

• Designed to improve probe replaceability, dramatically reducing system downtime caused by probe replacement.

• High-speed testing at up to 0.025 sec./step

• Detection of IC lead float and pseudo-contact states

• Support for active testing (optional feature)

• High-precision probing

• Large testing area of 510 × 460 mm (FA1240-61)

• Standard transport capability

• Automatic alignment function and simple visual test function

	FA1240-61 FA1241-61	FA1240-63
Number of arms	4 (L, ML, MR, R)
Number of test steps	40,000 (max.)
Measurement ranges	Resistance: 400 μΩ to 40 MΩ Capacitance: 1 pF to 400 mF Inductance: 1 μH to 100 H Diode VZ measurement: 0 to 25 V Zener diode VZ measurement: 0 to 25 V, 25 to 80 V (optional feature) Digital transistors: 0 to 25 V Photo couplers: 0 to 25 V Short: 0.4 Ω to 400 kΩ Open: 4 Ω to 40 MΩ DC voltage measurement: 0 to 25 V
Measurement time	Max. 0.025 sec./step	Max. 0.025 sec./step
Probing precision	Within ±100 μm for each arm (X and Y directions)
Positioning repeatability	Within ±50 μm (probing positions)
Inter-probe pitch	Min. 0.15 mm Min. 0.5 mm (when using 4-terminal probes)	Min. 0.15 mm Min. 0.5 mm (when using 4-terminal probes)
Testable board dimensions	510 mm (20.08 in) W × 460 mm (18.11 in) D	400 mm (15.75 in) W × 330 mm (12.99 in) D
Power supply	200 V AC (single-phase), 50/60 Hz, 6 kVA (FA1241: 230 V AC)	200 V AC (single-phase), 50/60 Hz, 5 kVA
Dimensions and mass	1406 mm (55.35 in) H × 1300 mm (51.18 in) H × 1380 mm (54.33 in) D, 1150 kg (40,564.4 oz)	1266 mm (49.84 in) H × 1369 mm (53.90 in) H × 1425 mm (56.10 in) D, 1050 kg (37,037 oz)